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Exploring the World at the Nanoscale: Atomic Force Microscope
The Atomic Force Microscope (AFM) is one of the most important instruments in modern science, enabling researchers to visualize and manipulate materials at the nanoscale. Since its invention in the 1980s, the AFM has transformed multiple fields, from materials science and nanotechnology to biology and electronics. Unlike traditional optical microscopes, which are limited by the wavelength of light, the AFM allows scientists to explore surfaces with atomic-level precision.
An AFM works by scanning a sharp probe, typically just a few nanometers wide, across the surface of a sample. The probe is attached to a cantilever, and as it moves over the sample, tiny forces between the tip and the sample cause the cantilever to bend. These deflections are measured using a laser and photodetector system, producing detailed three-dimensional images of the surface topology. This technique allows scientists to observe features that…